Paper Title:
Application of Focused Ion Beam Miller in Fracture Characterization
  Abstract

  Info
Periodical
Edited by
Hiroshige Suzuki, Katsutoshi Komeya and Mototsugu Sakai
Pages
297-300
DOI
10.4028/www.scientific.net/KEM.247.297
Citation
Z. H. Xie, P. R. Munroe , M. Hoffman, R. J. Moon, Y. B. Cheng, "Application of Focused Ion Beam Miller in Fracture Characterization", Key Engineering Materials, Vol. 247, pp. 297-300, 2003
Online since
August 2003
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Price
$32.00
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