Paper Title:
Improvement of C-V Characteristics and Control of Interlayer Growth of Rare Earth Oxide Stabilized Zirconia Epitaxial Gate Dielectrics
  Abstract

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Periodical
Edited by
T. Kimura, T. Takenaka, S. Fujitsu and K. Shinozaki
Pages
137-142
DOI
10.4028/www.scientific.net/KEM.248.137
Citation
T. Kiguchi, K. Shinozaki, N. Wakiya, N. Mizutani, "Improvement of C-V Characteristics and Control of Interlayer Growth of Rare Earth Oxide Stabilized Zirconia Epitaxial Gate Dielectrics", Key Engineering Materials, Vol. 248, pp. 137-142, 2003
Online since
August 2003
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