Effect of Ho Amount on Microstructure and Electrical Properties of Ni-MLCC |
| Journal |
Key Engineering Materials (Volume 248) |
| Volume |
Electroceramics in Japan VI |
| Edited by |
T. Kimura, T. Takenaka, S. Fujitsu and K. Shinozaki |
| Pages |
183-186 |
| DOI |
10.4028/www.scientific.net/KEM.248.183 |
| Citation |
Hirokazu Chazono et al., 2003, Key Engineering Materials, 248, 183 |
| Online since |
August, 2003 |
| Authors |
Hirokazu Chazono, Hiroshi Kishi |
| Keywords |
I-V Characteristic, Barium Titanate, Grain Boundary, Grain Growth, HALT, I-t Characteristics, Ni-MLCC |
| Full Paper |
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