Structural and Electronic Features of Metal - Oxide Interfaces |
| Journal |
Key Engineering Materials (Volume 253) |
| Volume |
Ceramic Interfaces: Properties and Applications V |
| Edited by |
Keizo Uematsu and Harumi Yokokawa |
| Pages |
1-16 |
| DOI |
10.4028/www.scientific.net/KEM.253.1 |
| Citation |
E. Gillet et al., 2003, Key Engineering Materials, 253, 1 |
| Online since |
November, 2003 |
| Authors |
E. Gillet, C. Lemire, M. Gillet |
| Keywords |
AES, EELS, LEED, Metal/Oxide Interface, MgO, Oxygen Vacancy, SSIMS, TEM, WO3, X-Ray Photoelectron Spectroscopy (XPS), α -Al2O3 , γ-Alumina |
| Full Paper |
Get the full paper by clicking here
|