Paper Title:
A Novel Profilometer for Nanometric Form Assessment for Large Machined Surfaces
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 257-258)
Edited by
Thomas Pearce, Yongsheng Gao, Jun'ichi Tamaki and Tsunemoto Kuriyagawa
Pages
225-230
DOI
10.4028/www.scientific.net/KEM.257-258.225
Citation
H. Yang, S. Kim, D. Walker, "A Novel Profilometer for Nanometric Form Assessment for Large Machined Surfaces", Key Engineering Materials, Vols. 257-258, pp. 225-230, 2004
Online since
February 2004
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Price
$32.00
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