Paper Title:
Non-Contact Measurement of Dielectric Constant for a Nanometer-Thick Polymer Film
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Periodical
Key Engineering Materials (Volumes 270-273)
Edited by
Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee
Pages
1143-1146
DOI
10.4028/www.scientific.net/KEM.270-273.1143
Citation
G. W. Park, Y. J. Hur, J. H. Kim, S. H. Kim, S. R. Keum, K. N. Koh, "Non-Contact Measurement of Dielectric Constant for a Nanometer-Thick Polymer Film", Key Engineering Materials, Vols. 270-273, pp. 1143-1146, 2004
Online since
August 2004
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