X-Ray Stress and Diffraction Line Width Measurement by the Gaussian Curve and Parabola Methods |
| Journal |
Key Engineering Materials (Volumes 270 - 273) |
| Volume |
Advances in Nondestructive Evaluation |
| Edited by |
Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee |
| Pages |
126-132 |
| DOI |
10.4028/www.scientific.net/KEM.270-273.126 |
| Citation |
Zhong Wei Liu et al., 2004, Key Engineering Materials, 270-273, 126 |
| Online since |
August, 2004 |
| Authors |
Zhong Wei Liu, Masanori Kurita |
| Keywords |
Experimental Mechanics, Residual Stress Measurement, Statistical Analysis, Stress Analysis, X-Ray Diffraction (XRD) |
| Full Paper |
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