Paper Title:
X-Ray Stress and Diffraction Line Width Measurement by the Gaussian Curve and Parabola Methods
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 270-273)
Edited by
Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee
Pages
126-132
DOI
10.4028/www.scientific.net/KEM.270-273.126
Citation
Z. W. Liu, M. Kurita, "X-Ray Stress and Diffraction Line Width Measurement by the Gaussian Curve and Parabola Methods ", Key Engineering Materials, Vols. 270-273, pp. 126-132, 2004
Online since
August 2004
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Price
$32.00
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