Analysis of Beta-Ray Data Using the Wavelet Thresholding Method and Extended Kalman Filter |
| Journal |
Key Engineering Materials (Volumes 270 - 273) |
| Volume |
Advances in Nondestructive Evaluation |
| Edited by |
Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee |
| Pages |
174-179 |
| DOI |
10.4028/www.scientific.net/KEM.270-273.174 |
| Citation |
Sung Hwan Han et al., 2004, Key Engineering Materials, 270-273, 174 |
| Online since |
August, 2004 |
| Authors |
Sung Hwan Han, Hyeon Ho Kim, Hyeon Deok Bae |
| Keywords |
Extended Kalman Filter (EKF), PM10, Poisson Process, Wavelet Thresholding Method |
| Full Paper |
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