Line Defect Detection in TFT-LCD Using Directional Filter Bank and Adaptive Multilevel Thresholding |
| Journal |
Key Engineering Materials (Volumes 270 - 273) |
| Volume |
Advances in Nondestructive Evaluation |
| Edited by |
Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee |
| Pages |
233-238 |
| DOI |
10.4028/www.scientific.net/KEM.270-273.233 |
| Citation |
Jong Hwan Oh et al., 2004, Key Engineering Materials, 270-273, 233 |
| Online since |
August, 2004 |
| Authors |
Jong Hwan Oh, Dong Min Kwak, Kyu Bong Lee, Young Chul Song, Doo Hyun Choi, Kil Houm Park |
| Keywords |
Directional Filter Bank, Inspection, LCM, Line-Defect, Line-Mura |
| Full Paper |
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