Paper Title:
Time-Domain Noise Analysis of CMOS Readout Ic for CZT X-Ray Detectors
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Periodical
Key Engineering Materials (Volumes 270-273)
Edited by
Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee
Pages
239-244
DOI
10.4028/www.scientific.net/KEM.270-273.239
Citation
T. H. Lee, J. H. Ha, S. Y. Lee, W. I. Ko, D. Y. Song, H. D. Kim, "Time-Domain Noise Analysis of CMOS Readout Ic for CZT X-Ray Detectors", Key Engineering Materials, Vols. 270-273, pp. 239-244, 2004
Online since
August 2004
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