Paper Title:
Development and Characterization of a Flat-Panel Detector-Based Microtomography System
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 270-273)
Edited by
Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee
Pages
245-251
DOI
10.4028/www.scientific.net/KEM.270-273.245
Citation
S. C. Lee, H. Y. Kim, I. K. Chun, M. H. Cho, M. H. Cho, S. Y. Lee, "Development and Characterization of a Flat-Panel Detector-Based Microtomography System ", Key Engineering Materials, Vols. 270-273, pp. 245-251, 2004
Online since
August 2004
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