Paper Title:
Two-Wave Mixing Interferometer for Ultrasonic NDT in Defect Detection
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 270-273)
Edited by
Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee
Pages
359-363
DOI
10.4028/www.scientific.net/KEM.270-273.359
Citation
C. H. Ho, J. Y. Lee, H. C. Shih, J. H. Shaw, Y. H. Liu, "Two-Wave Mixing Interferometer for Ultrasonic NDT in Defect Detection", Key Engineering Materials, Vols. 270-273, pp. 359-363, 2004
Online since
August 2004
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Price
$32.00
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