Paper Title:
Applications of a Capacitive Probe to Detect Defects on Dielectric Materials
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 270-273)
Edited by
Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee
Pages
606-611
DOI
10.4028/www.scientific.net/KEM.270-273.606
Citation
Y. J. Kim, J. G. Lee, B. Y. Ahn, S. S. Lee, "Applications of a Capacitive Probe to Detect Defects on Dielectric Materials", Key Engineering Materials, Vols. 270-273, pp. 606-611, 2004
Online since
August 2004
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