Paper Title:
The Detection of Defects in Paramagnetic Materials Using Locally Focused Electromagnetic Field Technique
  Abstract

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Periodical
Key Engineering Materials (Volumes 270-273)
Edited by
Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee
Pages
625-629
DOI
10.4028/www.scientific.net/KEM.270-273.625
Citation
H. Kim, T. Shoji, "The Detection of Defects in Paramagnetic Materials Using Locally Focused Electromagnetic Field Technique ", Key Engineering Materials, Vols. 270-273, pp. 625-629, 2004
Online since
August 2004
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Price
$32.00
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