Paper Title:
Full-Field Measurement of Deformation of Recycled Paper Using Electronic Speckle Pattern Interferometry
  Abstract

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Periodical
Key Engineering Materials (Volumes 270-273)
Edited by
Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee
Pages
686-689
DOI
10.4028/www.scientific.net/KEM.270-273.686
Citation
E. Umezaki, J. Takakuwa, "Full-Field Measurement of Deformation of Recycled Paper Using Electronic Speckle Pattern Interferometry ", Key Engineering Materials, Vols. 270-273, pp. 686-689, 2004
Online since
August 2004
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Price
$32.00
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