Paper Title:
Quantitative Evaluation of Defect inside Tire by Shearography
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 270-273)
Edited by
Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee
Pages
696-702
DOI
10.4028/www.scientific.net/KEM.270-273.696
Citation
K. S. Kim, I. Y. Yang, K. S. Kang, S. M. Yang, S. K. Cheong, "Quantitative Evaluation of Defect inside Tire by Shearography", Key Engineering Materials, Vols. 270-273, pp. 696-702, 2004
Online since
August 2004
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Price
$32.00
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