Paper Title:
Dynamic ESPI (DESPI) for Non-Destructive Testing
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 270-273)
Edited by
Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee
Pages
715-717
DOI
10.4028/www.scientific.net/KEM.270-273.715
Citation
S. Toyooka, V. Madjarova, H. Kadono, "Dynamic ESPI (DESPI) for Non-Destructive Testing", Key Engineering Materials, Vols. 270-273, pp. 715-717, 2004
Online since
August 2004
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Price
$32.00
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