Ultrasonic Characterization of Thin Film Material Constants and Defects |
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| Journal | Key Engineering Materials (Volumes 270 - 273) |
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| Volume | Advances in Nondestructive Evaluation |
| Edited by | Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee |
| Pages | 8-13 |
| DOI | 10.4028/www.scientific.net/KEM.270-273.8 |
| Online since | August, 2004 |
| Authors | Jan D. Achenbach |
| Keywords | Acoustic Microscopy, Laser-Based Ultrasonics, Material Property, Measurement Models, Thin Film |
| Full Paper | 
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