Ultrasonic Characterization of Thin Film Material Constants and Defects |
| Journal |
Key Engineering Materials (Volumes 270 - 273) |
| Volume |
Advances in Nondestructive Evaluation |
| Edited by |
Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee |
| Pages |
8-13 |
| DOI |
10.4028/www.scientific.net/KEM.270-273.8 |
| Citation |
Jan D. Achenbach, 2004, Key Engineering Materials, 270-273, 8 |
| Online since |
August, 2004 |
| Authors |
Jan D. Achenbach |
| Keywords |
Acoustic Microscopy, Laser-Based Ultrasonics, Material Property, Measurement Models, Thin Film |
| Full Paper |
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