Paper Title:
Ultrasonic Characterization of Thin Film Material Constants and Defects
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 270-273)
Edited by
Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee
Pages
8-13
DOI
10.4028/www.scientific.net/KEM.270-273.8
Citation
J. D. Achenbach, "Ultrasonic Characterization of Thin Film Material Constants and Defects", Key Engineering Materials, Vols. 270-273, pp. 8-13, 2004
Online since
August 2004
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Price
$32.00
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