Paper Title:
Nondestructive and Destructive Characterization of Nano-Structured Multilayer
  Abstract

  Info
Periodical
Key Engineering Materials (Volumes 270-273)
Edited by
Seung-Seok Lee, Dong-Jin Yoon, Joon-Hyun Lee and Sekyung Lee
Pages
849-854
DOI
10.4028/www.scientific.net/KEM.270-273.849
Citation
T. G. Kim, S. Y. Lee, I. Y. Kang, Y. C. Chung, J. H. Ahn, "Nondestructive and Destructive Characterization of Nano-Structured Multilayer", Key Engineering Materials, Vols. 270-273, pp. 849-854, 2004
Online since
August 2004
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