X-Ray Image Analysis Based on Fractal Dimension |
| Journal |
Key Engineering Materials (Volumes 277 - 279) |
| Volume |
On the Convergence of Bio-, Information-, Enrivonmental-, Energy-, Space- and Nano-Technolgies |
| Edited by |
Kwang Hwa Chung, Yong Hyeon Shin, Sue-Nie Park, Hyun Sook Cho, Soon-Ae Yoo, Byung Joo Min, Hyo-Suk Lim and Kyung Hwa Yoo |
| Pages |
189-192 |
| DOI |
10.4028/www.scientific.net/KEM.277-279.189 |
| Citation |
Seon Hee Park, 2005, Key Engineering Materials, 277-279, 189 |
| Online since |
January, 2005 |
| Authors |
Seon Hee Park |
| Full Paper |
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