Paper Title:
Fabrication of Silica Colloidal Crystal Multilayer with Controlled Thicknesses by Vertical Deposition
  Abstract

The silica colloidal crystal multilayers were deposited from ethanol suspensions with different particle concentrations by vertical deposition method. The microstructures and thicknesses of silica colloidal multilayers were characterized by scanning electron micrography. The thicknesses of colloidal crystal multilayers increased with the particle concentration increasing within a certain range of particles concentrations. When the particle concentration exceeded 2.48wt%, the thicknesses of colloidal crystal multilayers didn’t increased with the concentration increasing. Colloidal crystal multilayers with few defects could be deposited from the suspensions with the particle concentration 2.48wt%. The optical properties of the silica colloidal multilayers were investigated by a UV-Vis scanning spectrophotometer in normal incidence. They corresponded well to the microstructure obtained by SEM images.

  Info
Periodical
Key Engineering Materials (Volumes 280-283)
Edited by
Wei Pan, Jianghong Gong, Chang-Chun Ge and Jing-Feng Li
Pages
1149-1152
DOI
10.4028/www.scientific.net/KEM.280-283.1149
Citation
Q. Y. Li, W. M. Gao, Y. F. Chen, P. Dong, Z. J. Wu, "Fabrication of Silica Colloidal Crystal Multilayer with Controlled Thicknesses by Vertical Deposition", Key Engineering Materials, Vols. 280-283, pp. 1149-1152, 2005
Online since
February 2007
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Price
$32.00
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