Paper Title:
Preparation and Characterization of Compositionally Graded Epitaxial Barium Strontium Titanate Thin Films via Scanning Probe Microscopy
  Abstract

Epitaxially graded barium strontium titanate (BaxSr1-x)TiO3 (x = 0.75, 0.8, 0.9, 1.0, abbreviated as BST75, BST80, BST90 and BTO respectively) thin films were fabricated by pulsed laser deposition method on the (La0.7Sr0.3)MnO3 (LSMO)/LaAlO3 (LAO) single crystal substrate. Scanning probe microscopy with a contact mode was used to characterize the temperature dependence of polarization from room temperature to 140°C. Results indicated that the piezo-response signal of the BST graded films had an obvious change with temperature, and that the graded structures had a flatter temperaturedependence of permittivity. Furthermore, the contrasts of the SPM images were lower for the ferroelectric – paraelectric (F-P) phase transition temperatures of BST 75, BST 80, and BST90, but higher for the F-P transition temperature of BTO.

  Info
Periodical
Key Engineering Materials (Volumes 280-283)
Edited by
Wei Pan, Jianghong Gong, Chang-Chun Ge and Jing-Feng Li
Pages
1903-1908
DOI
10.4028/www.scientific.net/KEM.280-283.1903
Citation
S. G. Lu, H. Chen, C.L. Mak, K.H. Wong, H.W.L. Chan, C.L. Choy, J. J. Xu, S. Q. Shi, "Preparation and Characterization of Compositionally Graded Epitaxial Barium Strontium Titanate Thin Films via Scanning Probe Microscopy", Key Engineering Materials, Vols. 280-283, pp. 1903-1908, 2005
Online since
February 2007
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Price
$32.00
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