Main Theme:
Measurement Technology and Intelligent Instruments VI
Volumes 295 - 296
doi:
10.4028/www.scientific.net/KEM.295-296
Paper Titles published in this Main Theme:
| Paper Title |
Page |
|
Laser Scattering Measurement of Microdefects on Silicon Oxide Wafer
Authors: Taeho Ha, Takashi Miyoshi, Yasuhiro Takaya, S. Takahashi
|
3
|
|
Characterisation of Surface Properties by a Multi-Function TPM
Authors: Xian Ping Liu, J. Zhang
|
9
|
|
Development of an Evanescent Light Measurement System for Si Wafer Microdefect Detection
Authors: S. Takahashi, R. Nakajima, Takashi Miyoshi, Yasuhiro Takaya, Kiyoshi Takamasu
|
15
|
|
An Embedded FBG Sensor for Dynamic Strain Measurement for a Clamped-Clamped Composite Structure
Authors: Hang Yin Ling, Alan Kin Tak Lau, Li Cheng, J. Wei, R.S. Thomson, M.L. Scott
|
21
|
|
A Thermovision Method for Studying Deformation Kinetics of Materials and Structure Elements
Authors: Evgeny S. Lukin, Alexander M. Ivanov
|
27
|
|
Damage Detection of Composite Structures Using Dynamic Analysis
Authors: L.H. Yam, Li Cheng, Z. Wei, Y.J. Yan
|
33
|
|
Investigation of Nonisothermal Crystallization Behaviors of Poly and Silica Nanocomposites Using Differential Scanning Calorimetry
Authors: Ling Xue Kong, Z. Peng
|
39
|
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Ellipsometric Detection of Transitional Surface Structures on Decapped GaAs(001)
Authors: A.V. Vasev, S.I. Chikichev
|
45
|
|
Temperature Effect on the Stability of CuO Nanofluids Based on Measured Particle Distribution
Authors: Ho Chang, Chih Hung Lo, Tsing Tshih Tsung, Y.Y. Cho, D.C. Tien, Liang Chia Chen, C.H. Thai
|
51
|
|
Determination of Young's Modulus of Micromechanical Silicon Films Using an Acoustic Excitation and Optical Detection Resonance Method
Authors: Y.M. Liu, W.J. Tian, S.J. Zhang
|
57
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Showing 1 to 10 of 123 Paper Titles