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Measurement Technology and Intelligent Instruments VI

Key Engineering Materials Volumes 295 - 296

• Papers
• Abstracts

• p3 Laser Scattering Measurement of Microdefects on Silicon Oxide Wafer   [ 338 K ]
  Authors: Taeho Ha, Takashi Miyoshi, Yasuhiro Takaya, S. Takahashi
• p9 Characterisation of Surface Properties by a Multi-Function TPM   [ 564 K ]
  Authors: X.P. Liu, J. Zhang
• p15 Development of an Evanescent Light Measurement System for Si Wafer Microdefect Detection   [ 2 M ]
  Authors: S. Takahashi, R. Nakajima, Takashi Miyoshi, Yasuhiro Takaya, Kiyoshi Takamasu
• p21 An Embedded FBG Sensor for Dynamic Strain Measurement for a Clamped-Clamped Composite Structure   [ 1 M ]
  Authors: Hang Yin Ling, Alan Kin Tak Lau, Li Cheng, J. Wei, R.S. Thomson, M.L. Scott
• p27 A Thermovision Method for Studying Deformation Kinetics of Materials and Structure Elements   [ 440 K ]
  Authors: Evgeny S. Lukin, Alexandr M. Ivanov
• p33 Damage Detection of Composite Structures Using Dynamic Analysis   [ 99 K ]
  Authors: L.H. Yam, Li Cheng, Z. Wei, Y.J. Yan
• p39 Investigation of Nonisothermal Crystallization Behaviors of Poly and Silica Nanocomposites Using Differential Scanning Calorimetry   [ 145 K ]
  Authors: Ling Xue Kong, Z. Peng
• p45 Ellipsometric Detection of Transitional Surface Structures on Decapped GaAs(001)   [ 6 M ]
  Authors: A.V. Vasev, S.I. Chikichev
• p51 Temperature Effect on the Stability of CuO Nanofluids Based on Measured Particle Distribution   [ 677 K ]
  Authors: Ho Chang, Chih Hung Lo, Tsing Tshih Tsung, Y.Y. Cho, D.C. Tien, Liang Chia Chen, C.H. Thai
• p57 Determination of Young's Modulus of Micromechanical Silicon Films Using an Acoustic Excitation and Optical Detection Resonance Method   [ 119 K ]
  Authors: Y.M. Liu, W.J. Tian, S.J. Zhang
• p65 A High Precision AFM for Nanometrology of Large Area Micro-Structured Surfaces   [ 530 K ]
  Authors: J. Aoki, Wei Gao, S. Kiyono, T. Ono
• p71 A Study on the Mechanism of a New High Speed Scanning Miniature Nano-Measurement Probe   [ 484 K ]
  Authors: Kuang Chao Fan, Y.J. Chen
• p77 Use of Fiber Interferometer for AFM Cantilever Probe Displacement Control   [ 260 K ]
  Authors: N.C. Shie, T.L. Chen, Kai Yuan Cheng
• p83 Determining the Radial Modulus of DNA Measured by VPSFM   [ 214 K ]
  Authors: Y.H. Chen, X.J. Li, X.F. Zhou, Jia Lin Sun, W.H. Huang, J. Hu
• p89 Pitch Calibration by an Active Temperature Controlled Traceable Atomic Force Microscope and a Laser Diffractometer   [ 24 M ]
  Authors: Chao Jung Chen, S.P. Pan, L.C. Chang