Characterisation of Surface Properties by a Multi-Function TPM |
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| Journal | Key Engineering Materials (Volumes 295 - 296) |
|---|---|
| Volume | Measurement Technology and Intelligent Instruments VI |
| Edited by | Yongsheng Gao, Shuetfung Tse and Wei Gao |
| Pages | 9-14 |
| DOI | 10.4028/www.scientific.net/KEM.295-296.9 |
| Citation | Xian Ping Liu et al., 2005, Key Engineering Materials, 295-296, 9 |
| Online since | October, 2005 |
| Authors | Xian Ping Liu, J. Zhang |
| Keywords | Friction, Measurement of Surface Properties, Nano Hardness, Nanotribology, Scanning Probe Microscope, Surface Characterisation |
| Abstract | A novel measurement system, the multi-functional Tribological Probe Microscope (TPM), has been developed to provide multi-function measurements of surface and surface properties. These properties are topography, friction, Young’s modulus, and nano-hardness. They are measured, point-by-point, in a single scan set up. The four function maps of surface topography, friction, hardness and Young’s modulus are correlated in space and time. In this paper we will brief the TPM system and demonstrate the capability of the multi-function evaluation of engineering surfaces and their correlated nature between these functions. It is believed that such direct correlated measurements will help scientist and engineers to understand surface and surface related properties and eventually to design and optimise a surface for a better performance. |
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