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Measurement Technology and Intelligent Instruments VI

Key Engineering Materials Volumes 295 - 296

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• p189 A Two-Color Heterodyne Interferometer Based on Diffraction Grating for Displacement Measurement   [ 146 K ]
  Authors: G.H. Wu, Z.J. Cai, Li Jiang Zeng
• p195 A New Method for the Development of Frequency Standards for the Optical Wavelength Range of 243nm   [ 287 K ]
  Authors: E.K. Izrailov, V.F. Ezhov
• p201 Optical Measurement Technologies and Systems for Industrial Applications   [ 860 K ]
  Authors: Yuri V. Chugui
• p209 Influence of the Size of Round Objects on the Output Signal of Laser Measuring Scanner   [ 650 K ]
  Authors: Ryszard Jabłoński
• p215 A Study on the Multi-Wavelength Drop Analysis Technology   [ 152 K ]
  Authors: G. Hao, Zu Rong Qiu, Guo Xiong Zhang, A.P. Zhang
• p221 Accurate Estimation of Phase Distribution on Reference Plane in Grating Projection Measurement   [ 418 K ]
  Authors: M.R. Zhao, Yu Cheng Lin, X.B. Niu, D.M. Cheng
• p227 Measurement of Core Position of Fiber Array by a Calibrated Mask Method   [ 162 K ]
  Authors: S.W. Hsu, Y.D. Jiaan, M.S. Huang
• p233 Detection of Random Defects on Highly Reflective and Complex Surfaces   [ 426 K ]
  Authors: Xing Hua Qu, Y. He, G.X. Jia, J.M. Ding, S.H. Ye
• p239 Automatic Laser Monitoring for Dam Safety   [ 705 K ]
  Authors: K.D. Yue, X. Zhou, J. Gao
• p245 An Application of the Kalman Filter in a Laser Tracking Measurement System   [ 70 K ]
  Authors: X.R. Chen, P. Cai, Wen Ku Shi
• p253 A Scanning Multi-Probe Straightness Measurement System for Alignment of Linear Collider Accelerator   [ 372 K ]
  Authors: Wei Gao, J. Yokoyama, S. Kiyono, N. Hitomi
• p259 Measurement of the Straightness of a Leadscrew-Driven Precision Stage   [ 426 K ]
  Authors: Yoshikazu Arai, Wei Gao, S. Kiyono, Tsunemoto Kuriyagawa
• p265 A Circular Profile Measurement Method Using Software Techniques   [ 161 K ]
  Authors: Eiki Okuyama, Kimiyuki Mitsui
• p271 A High Precision Circuit Based on Digital Techniques for Roundness Measurement   [ 1 M ]
  Authors: W.Q. Zhao, Jiu Bin Tan, Z. Xue, Z.D. Feng
• p277 A Circle Contour Measurement Technique Based on Randomized Hough Transform Using Gradient Information   [ 325 K ]
  Authors: Ji Wen Cui, Jiu Bin Tan