Paper Title:
Force-Calibrated AFM for Mechanical Test of Freestanding Thin Films
  Abstract

Atomic force microscope (AFM) is a powerful tool for exploring a nano-scale world. It can measure a nano-scale surface topography with very high resolution and detect a very small force. In this paper, we propose a novel AFM cantilever and its calibration scheme to utilize AFM as a mechanical testing machine. We call this AFM with a new cantilever as a force-calibrated AFM. The feasibility of the AFM cantilever is validated through measurement of mechanical properties of freestanding Au thin films.

  Info
Periodical
Key Engineering Materials (Volumes 297-300)
Edited by
Young-Jin Kim, Dong-Ho Bae and Yun-Jae Kim
Pages
275-279
DOI
10.4028/www.scientific.net/KEM.297-300.275
Citation
H. J. Lee, K. H. Cho, J. H. Kim, S. W. Han, B. I. Choi, C. W. Baek, J. M. Kim, S. H. Choa, "Force-Calibrated AFM for Mechanical Test of Freestanding Thin Films ", Key Engineering Materials, Vols. 297-300, pp. 275-279, 2005
Online since
November 2005
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Price
$32.00
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