Paper Title:
Raman Piezo-Spectroscopic Investigation of Microscopic Residual Stresses in Ni-MLCC Devices
  Abstract

Residual stresses in Ni-MLCC were investigated by Raman microprobe piezo-spectroscopic (PS) methods. The shape of the Raman spectrum of BaTiO3 in Ni-MLCC depended on the angle between the polarizing direction of the incident laser beam and the direction of the internal electrode. From a set of precise calibrations, we show that the orientation dependence arises from the interaction between internal stresses and the polycrystalline microstructure; by taking into account such an orientation dependence, we were able to establish a technique for the measurement of the distribution of residual stresses in Ni-MLCC.

  Info
Periodical
Edited by
Masaru Miyayama, Tadashi Takenaka, Masasuke Takata and Kazuo Shinozaki
Pages
31-36
DOI
10.4028/www.scientific.net/KEM.301.31
Citation
T. Sakashita, K. Nakamura, G. Pezzotti, H. Chazono, "Raman Piezo-Spectroscopic Investigation of Microscopic Residual Stresses in Ni-MLCC Devices", Key Engineering Materials, Vol. 301, pp. 31-36, 2006
Online since
January 2006
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$32.00
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