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Fabrication of Flat PZT Cantilevers through MEMS Technologies and Application to Optical MEMS

Journal Key Engineering Materials (Volume 301)
Volume Electroceramics in Japan VIII
Edited by Masaru Miyayama, Tadashi Takenaka, Masasuke Takata and Kazuo Shinozaki
Pages 37-40
DOI 10.4028/www.scientific.net/KEM.301.37
Citation Takeshi Kobayashi et al., 2006, Key Engineering Materials, 301, 37
Online since January, 2006
Authors Takeshi Kobayashi, Jiunnjye Tsaur, Masaaki Ichiki, Ryutaro Maeda
Keywords Cantilever, Film, Micro-Electromechanical Systems (MEMS), Optical MEMS, PZT, Scanner
Abstract

Flat PZT cantilevers have been successfully fabricated from the Pt/Ti/PZT/Pt/Ti/SiO2/SOI multi-layered structure through MEMS technologies. A displacement of the tip of the cantilever driven at 6 V is measured to be 7.6 μm and the transverse piezoelectric constant calculated from the displacement is –103 pm/V. 1D optical scanners have been designed, simulated, fabricated and tested. The rotation angles of the mirror of the scanners were 60-70% of the simulated values.

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