Synthesis and Properties of Nd-Substituted Bismuth Titanate Polycrystalline Thin Films with a-/b-Axes Orientation |
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| Journal | Key Engineering Materials (Volume 301) |
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| Volume | Electroceramics in Japan VIII |
| Edited by | Masaru Miyayama, Tadashi Takenaka, Masasuke Takata and Kazuo Shinozaki |
| Pages | 57-60 |
| DOI | 10.4028/www.scientific.net/KEM.301.57 |
| Citation | Masahiro Kurachi et al., 2006, Key Engineering Materials, 301, 57 |
| Online since | January, 2006 |
| Authors | Masahiro Kurachi, Hirofumi Matsuda, Takashi Iijima, Hiroshi Uchida, Seiichiro Koda |
| Keywords | Bismuth Layer Structured Ferroelectrics, Chemical Solution Deposition, Lanthanoids, Orientation Control, Poly-Crystalline Film |
| Abstract | Nd-substituted Bi4Ti3O12 (BNT) polycrystalline thin films with preferred a-/b-axes orientations were grown on sputter-grown IrO2(101) layers by chemical solution deposition method. After optimizing the heat treatment conditions, insulating characters and ferroelectric properties in 250-nm-thick BNT thin films with a-/b-axes orientations were investigated at room temperature. Low leakage current density of J=10-7~10-8 A/cm2 at 100 kV/cm and fair value of remnant polarization (2Pr=31 μC/cm2 at 400 kV/cm) were measured even though the Bi2O2 blocking layer aligned parallel to the film normal. |
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