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Rietveld Studies on Silicon Substituted Hydroxyapatite

Journal Key Engineering Materials (Volumes 309 - 311)
Volume Bioceramics 18
Edited by Takashi Nakamura, Kimihiro Yamashita and Masashi Neo
Pages 113-116
DOI 10.4028/www.scientific.net/KEM.309-311.113
Citation Shuo Zou et al., 2006, Key Engineering Materials, 309-311, 113
Online since May, 2006
Authors Shuo Zou, Jie Huang, Serena Best, William Bonfield
Keywords Lattice Parameter, Rietveld Refinement, Silicon Substituted Hydroxyapatite, X-Ray Diffraction (XRD)
Abstract

Silicon-substituted hydroxyapatite (SiHA) attracts particular interest due its enhanced bioactivity compared with pure hydroxyapatite. In this study we seek to clarify the effects on the lattice parameters of both composition and sintering temperature in experimentally-produced HA and 0.8wt% SiHA, 1.5wt% SiHA and 2.0wt% SiHA sintered at 800oC and 1200oC. X ray diffraction was used to determine the phase purity and crystallographic structure. We found that while the c parameter increased with increasing silicon concentration, the a parameter decreased with initial silicon incorporation then recovered with further increases in silicon incorporation. The calcium (2) channel expanded with silicon incorporation while tetrahedron distortion index (TDI) and the radius of the P channel showed a similar dependence on silicon content as the a parameter.

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