Paper Title:

Development of Piezo-Spectroscopic Techniques for Nano-Scale Stress Analysis in the Scanning Electron Microscope of Zirconia Bioceramics Based on Rare-Earth Fluorescence

Periodical Key Engineering Materials (Volumes 309 - 311)
Main Theme Bioceramics 18
Edited by Takashi Nakamura, Kimihiro Yamashita and Masashi Neo
Pages 1215-1218
DOI 10.4028/www.scientific.net/KEM.309-311.1215
Citation Kiyotaka Yamada et al., 2006, Key Engineering Materials, 309-311, 1215
Online since May, 2006
Authors Kiyotaka Yamada, Junji Ikeda, Giuseppe Pezzotti
Keywords Phase Transformation, Piezo-Spectroscopy, Residual Stress, Zirconia
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Abstract

The electro-stimulated luminescence spectrum of a rare-earth ion added to zirconia (ZrO2) lattice was investigated with the aim of using it as a sensor for nano-scale stress (fluorescence piezo-spectroscopy) and phase transformation assessments in a field emission scanning electron microscope (FE-SEM). In this paper, the selected rare-earth fluorescent ion Eu, added to ZrO2 as a raw oxide powder (Eu2O3) before sintering (in the amount of 1.0 wt. %). Spectroscopic results indicated that the spectral shift of some fluorescent band of the selected rare-earth ion was sensitive to residual stress and that the electron-stimulated spectra of Eu2O3-doped ZrO2 in its tetragonal and monoclinic polymorphs were different to each other. Based on these findings, the luminescent substance can be useful as a “stress and phase transformation sensor”, in order to clarify the elementary mechanisms behind synthetic ZrO2.