Paper Title:

Colloidal Probe AFM Measurements of the Electrophoretic Force

Periodical Key Engineering Materials (Volume 314)
Main Theme Electrophoretic Deposition: Fundamentals and Applications II
Edited by A.R. Boccaccini, O. Van der Biest and R. Clasen
Pages 1-6
DOI 10.4028/
Citation Linda Stappers et al., 2006, Key Engineering Materials, 314, 1
Online since July, 2006
Authors Linda Stappers, Jan Fransaer
Keywords Atomic Force Microscope (AFM), Colloidal Probe, Electrophoretic Force
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Colloidal probe atomic force microscopy is a very useful tool in the study of colloidal interactions. Although this technique has been applied to study interactions between a particle and a polarized electrode during electrodeposition, it has never been used to study interactions in high electric fields as encountered in electrophoretic deposition. In this work, a preliminary study was undertaken to verify whether colloidal probe AFM could be used to measure the electrophoretic force on a particle. It was found that the electrophoretic force could be detected by colloidal probe AFM under certain circumstances. In order to prevent that the contribution of the cantilever on the measurement of the electrophoretic force becomes large, the charge on the cantilever should be small compared to the charge of the particle, which is attached to the cantilever. Moreover, the area of cantilever surface which is oriented parallel to the electric field should be small to minimize the contribution of the cantilever.

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