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Preparation of Epitaxial LiTaO3 Thin Films by Metal Organic Chemical Vapor Deposition and its Electrical and Optical Properties

Journal Key Engineering Materials (Volume 320)
Volume Electroceramics in Japan IX
Edited by Keiichi Katayama, Kazumi Kato, Tadashi Takenaka, Masasuke Takata and Kazuo Shinozaki
Pages 57-60
DOI 10.4028/www.scientific.net/KEM.320.57
Citation Takeki Yamamoto et al., 2006, Key Engineering Materials, 320, 57
Online since September, 2006
Authors Takeki Yamamoto, Naoki Wakiya, Nobuyasu Mizutani, Kazuo Shinozaki
Keywords Electrical Property, Epitaxial, LiTaO3, MOCVD, Optical Property, Thin Film
Abstract

Epitaxial LiTaO3 thin films were deposited on epitaxial Pt(111)/Al2O3(001) and Al2O3(001) substrates by metal organic chemical vapor deposition using LiTa(OC2H5)4(OC2H4OCH3)2 and Li(DPM) precursors. The full-width at half-maximum of the rocking curve of LiTaO3 thin films were respectively 0.29° on Al2O3(001) substrates and 0.98° on epitaxial Pt(111)/Al2O3(001). Electrical measurements showed that the remanent polarization and coercive field of the films were 2Pr=76 μC/cm2 and E =130 kV/cm, respectively. The leakage current density was 10-6–10-8 A/cm2 at 120 kV/cm. Refractive indices n measured at 632.8 nm were measured respectively as 2.15 on Al2O3(001) and 2.14 on Pt(111)/Al2O3(001).

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