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Optically Encoded Smart Dust from DBR Porous Silicon

Journal Key Engineering Materials (Volumes 321 - 323)
Volume Advanced Nondestructive Evaluation I
Edited by Seung-Seok Lee, Joon Hyun Lee, Ik Keun Park, Sung-Jin Song, Man Yong Choi
Pages 53-56
DOI 10.4028/www.scientific.net/KEM.321-323.53
Citation Bong Ju Lee et al., 2006, Key Engineering Materials, 321-323, 53
Online since October, 2006
Authors Bong Ju Lee, Sung Gi Kim, Hong Lae Sohn
Keywords Chemical Sensor, DBR Porous Silicon, Red-Shift, Reflectivity, Smart Dust
Abstract

Distributed Bragg reflector (DBR) porous silicons exhibiting unique reflectivity were successfully obtained by an electrochemical etching of silicon wafer using square wave currents. Optically encoded smart dust which retained optical reflectivity was obtained from DBR porous silicon film in organic solution by using ultra-sono method. The size of optically encoded smart dust was measured by field emission scanning electron micrograph (FESEM) and was about 500 nm to few microns depending on the duration of sonication. Investigation for the optical characteristics of smart dust revealed that smart dust could be useful for application such as chemical sensor for detecting organic vapors.

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