Experimental Mechanics in Nano and Biotechnology
Key Engineering Materials Volumes 326 - 328
doi:10.4028/www.scientific.net/KEM.326-328
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p-2
Committees
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88 K
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p-1
Preface
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11 K
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p1
Nano and Micro Mechanical Measurement of Interaction Forces Between Solid Surfaces
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822 K
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Authors: Kyung Suk Kim
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p5
Experimental Study on Electro-Magneto-Mechanical Behaviour of Electromagnetic Solids
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514 K
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Authors: Dai Ning Fang, Xu Jun Zhao, Yong Mao Pei, Zhan Wei Liu, Fa Xin Li, Xue Feng
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p13
Image Processing for Optical Methods to Analyze Shape, Deformation, Stress and Strain
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866 K
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Authors: Yoshiharu Morimoto
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p19
Development of Phase Shifting Device Using the Deflection of a Cantilever for Digital Holography
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9 M
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Authors: Hitomi Matsukawa, Motoharu Fujigaki, Toru Matui, Yoshiharu Morimoto
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p23
Vibration Analysis of Membrane by Time Average In-Line Digital Holographic Interferometry
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2 M
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Authors: Vijay Raj Singh, Anand Asundi
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p27
Effect of Phase-Shifting Error on Deformation Evaluation Using Phase-Shifting Digital Holography
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251 K
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Authors: Xin Kang, Xiao Yuan He, C.J. Tay, C. Quan
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p31
Real-Time Shape Measurement by Unwrapping Method Using Aliasing
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1 M
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Authors: Motoharu Fujigaki, Toshio Toyotake, Toru Matui, Yoshiharu Morimoto
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p35
A New Six-Step Phase Shifting Technique Using Mixed-Polariscope in Digital Photoelasticity
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698 K
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Authors: Manoharan Ramji, K. Ramesh
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p39
Instantaneous Spatial Phase-Stepping Methods for Phase-Measuring Interferometry and Photoelasticity
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810 K
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Authors: Satoru Yoneyama, M. Mizuhara, H. Kikuta, K. Moriwaki
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p43
Investigation of Effect of Grains on Deformation of Wood under Shearing Loads Using Electronic Speckle Pattern Interferometry
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576 K
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Authors: Eisaku Umezaki
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p47
Optical Interferometric Inspection of Surface Contour of MEMS-Components
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2 M
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Authors: C.J. Tay, S.H. Wang, C. Quan
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p51
Application of Wavelet Transform for Analyzing Instantaneous Contour of Continual Deformation Object
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625 K
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Authors: Fan Xui Chen, Xiao Yuan He
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p55
Analysis of Simultaneous Velocity and Density Distributions for High-Speed CO2 Flow Using Particle Image Velocimetry and Digital Speckle Tomography
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441 K
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Authors: Han Seo Ko, Yong Jae Kim, Oh Chae Kwon, Koji Okamoto