Nano and Micro Mechanical Measurement of Interaction Forces Between Solid Surfaces |
| Journal |
Key Engineering Materials (Volumes 326 - 328) |
| Volume |
Experimental Mechanics in Nano and Biotechnology |
| Pages |
1-4 |
| DOI |
10.4028/www.scientific.net/KEM.326-328.1 |
| Online since |
December, 2006 |
| Authors |
Kyung Suk Kim
|
| Keywords |
Atomic Force Microscope, Experimental Methods, Field Projection Method, Micro-Scale Friction Force, Nano-Scale Friction Force, Nano-Scale Inter-Surface Forces |
| Abstract |
Two different types of experimental methods have beeen developed for measuring lateral
interaction forces between two solid surfaces for nano- and micro-meter scale contacts. One is the
type of direct measurement methods which typically utilize AFM instrumentations. In the direct
lateral force measurements some size-scale effects are commonly observed due to the effects of
adhesion and surface roughness. A recent development of a fine AFM lateral force calibration
method, a diamagnetic lateral force calibrator, has made it possible to study such size-scale effects
systematically. The other type is the field projection method which requires a high resolution
measurement of a deformation field near the edge of a contact. For such measurements a
comprehensive map of deformation measurement techniques is introduced in a domain of spatial
and strain resolutions. This technique provides a way of assessing the non-uniform distribution of
the surface interaction forces for nano and micro-meter scale contacts. |
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