Nano and Micro Mechanical Measurement of Interaction Forces Between Solid Surfaces
| Periodical | Key Engineering Materials (Volumes 326 - 328) |
|---|---|
| Main Theme | Experimental Mechanics in Nano and Biotechnology |
| Edited by | Soon-Bok Lee and Yun-Jae Kim |
| Pages | 1-4 |
| DOI | 10.4028/www.scientific.net/KEM.326-328.1 |
| Citation | Kyung Suk Kim, 2006, Key Engineering Materials, 326-328, 1 |
| Online since | December, 2006 |
| Authors | Kyung Suk Kim |
| Keywords | Atomic Force Microscope (AFM), Experimental Methods, Field Projection Method, Micro-Scale Friction Force, Nano-Scale Friction Force, Nano-Scale Inter-Surface Forces |
| Price | US$ 28,- |
Two different types of experimental methods have beeen developed for measuring lateral interaction forces between two solid surfaces for nano- and micro-meter scale contacts. One is the type of direct measurement methods which typically utilize AFM instrumentations. In the direct lateral force measurements some size-scale effects are commonly observed due to the effects of adhesion and surface roughness. A recent development of a fine AFM lateral force calibration method, a diamagnetic lateral force calibrator, has made it possible to study such size-scale effects systematically. The other type is the field projection method which requires a high resolution measurement of a deformation field near the edge of a contact. For such measurements a comprehensive map of deformation measurement techniques is introduced in a domain of spatial and strain resolutions. This technique provides a way of assessing the non-uniform distribution of the surface interaction forces for nano and micro-meter scale contacts.
