Based on the principle of moiré techniques, a new method combined with Electric Addressing SLM technique was proposed. The specimen grating is modulated by the SLM system, and its the frequency can be changed with aid of a 4f Fourier system. The moiré is generated by the overlapped specimen grating and a reference grating in the Fourier system. Typical test is conducted with a polyurethane beam. The successful results verify the feasibility of the method, and show its good potential of further application to the in-plane deformation measurement.