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Inverse Method to Determine Mechanical Properties of Thin Film by Nanoindentation and Finite Element Analysis

Journal Key Engineering Materials (Volumes 326 - 328)
Volume Experimental Mechanics in Nano and Biotechnology
Edited by Soon-Bok Lee and Yun-Jae Kim
Pages 219-222
DOI 10.4028/www.scientific.net/KEM.326-328.219
Citation Dong Cheon Baek et al., 2006, Key Engineering Materials, 326-328, 219
Online since December, 2006
Authors Dong Cheon Baek, Soon Bok Lee
Keywords Finite Element Model (FEM), Mechanical Properties, Nanoindentation, Thin Film
Abstract

As a reliable tool to measure the Young’s modulus, nanoindention technique has been used widely recently. In this paper, nanoindetation technique was overviewed with its advantage and limitation and a new method was proposed to determine material properties of film, i.e. both Young’s modulus E and Poisson’s ratio ν from load-displacement curve of shallow-depth indentation using ‘inverse method’.

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