Paper Title:
Force Measurement by AFM Cantilever with Different Coating Layers
  Abstract

Atomic force microscopy (AFM) is widely used in many fields, because of its outstanding force measurement ability in nano scale. Some coating layers are used to enhance the signal intensity, but these coating layers affect the spring constant of AFM cantilever and the accuracy of force measurement. In this paper, the spring constants of rectangular cantilever with different coating thickness were quantitatively measured and discussed. The finite element method was used to analyze the nonlinear force-displacement behavior from which the cantilever’s normal and torsional spring constants could be determined. The experimental data and the numerical results were also compared with the results from other methods. By considering the influence of coating layers and real cantilever geometries, the more accurate force measurements by AFM cantilever can be obtained.

  Info
Periodical
Key Engineering Materials (Volumes 326-328)
Edited by
Soon-Bok Lee and Yun-Jae Kim
Pages
377-380
DOI
10.4028/www.scientific.net/KEM.326-328.377
Citation
M. K. Yeh, B. Y. Chen, N. H. Tai, C. C. Chiu, "Force Measurement by AFM Cantilever with Different Coating Layers", Key Engineering Materials, Vols. 326-328, pp. 377-380, 2006
Online since
December 2006
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: D.H. Choi, W. Hwang
Abstract:A new calibration method of frictional forces in atomic force microscopy (AFM) is suggested. An angle conversion factor is defined using the...
851
Authors: Yong Da Yan, Wei Tao Liu, Zhen Jiang Hu, Xue Sen Zhao, Jiu Chun Yan
Modeling, Analysis and Simulation of Manufacturing Processes
Abstract:To study the effect of different sample materials on the nano dynamic ploughing process in the AFM tapping mode, the spring-oscillator model...
492
Authors: Saurav Verma, Vinod Jain
Chapter 4: Advanced Materials and Manufacturing Design, Modelling, Simulation Technologies
Abstract:Cantilever-based sensors have emerged as a promising label free detection technique, which have been used for high precision mass detection...
205
Authors: Yu Wen Zhao, Yun Peng Song, Sen Wu, Xing Fu
Chapter 3: Measurements, Sensors and MEMS
Abstract:Atomic force microscope (AFM) is widely used to measure nanoforce in the analysis of nanomechanical and biomechanical properties. As the...
817