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Optical Interferometric Inspection of Surface Contour of MEMS-Components

Journal Key Engineering Materials (Volumes 326 - 328)
Volume Experimental Mechanics in Nano and Biotechnology
Edited by Soon-Bok Lee and Yun-Jae Kim
Pages 47-50
DOI 10.4028/www.scientific.net/KEM.326-328.47
Citation Cho Jui Tay et al., 2006, Key Engineering Materials, 326-328, 47
Online since December, 2006
Authors Cho Jui Tay, S.H. Wang, C. Quan
Keywords Micro-Accelerometer, Micro-Component, Micro-Electromechanical Systems (MEMS), Micro-Mirror, Optical Interferometry, Single Fiber-End Surface
Abstract

In this paper, we describe an optical interferometer applied to 3D inspection of microcomponents. The resulting interference fringes that are related to the deformation and surface contour of MEMS-components are analyzed by the fast Fourier transform (FFT) and 3-step phaseshifting algorithms. Experimental results show the feasibility of the proposed method for 3D deformation and surface contour measurement of micro-components.

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