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Experimental Mechanics in Nano and Biotechnology

Key Engineering Materials Volumes 326 - 328

• Papers
• Abstracts

• p179 A Study on Bore-Sighting for the Error Reduction of the XK11   [ 340 K ]
  Authors: Woon Joo Yeo, Je Wook Chae, Chan Lee, Eui Jung Choi, Jun Ho Lee
• p183 Measurement of Stress-Optical Coefficients of COC’s with Different Composition   [ 383 K ]
  Authors: Jong Sun Kim, Kyung Hwan Yoon, Julia A. Kornfield
• p187 A Study on the Birefringence Measurement in Injection Molded Parts Using Two Different Laser Sources and R-G-B Separation of White Light   [ 1 M ]
  Authors: Jong Sun Kim, Chul Jin Hwang, Kyung Hwan Yoon
• p191 Optical Retardation Measurement Using a Zeeman Laser   [ 140 K ]
  Authors: Jing Fung Lin, Yu Lung Lo
• p195 In Situ Fast Temperature Measurement of Silicon Thin Films during the Excimer Laser Annealing   [ 157 K ]
  Authors: Seung Jae Moon
• p199 Direct CTE Measurement Technique for the MEMS Materials   [ 1 M ]
  Authors: Chung Seog Oh, Sung Hoon Choa, Chang Seung Lee, Hak Joo Lee
• p203 Elastic and Plastic Mechanical Properties Determined by Nanoindentation and Numerical Simulation at Mesoscale   [ 1 M ]
  Authors: Feng Yuan Chen, Rwei Ching Chang
• p207 A Study of Nano-Indentation Test Using Rhombus-Shaped Cantilever in Atomic Force Microscope   [ 1 M ]
  Authors: Ki Ho Cho, Hak Joo Lee, Jae Hyun Kim, Jong Man Kim, Yong Kweon Kim, Chang Wook Baek
• p211 Static and Dynamic Deformation Measurements of Micro Beams by the Technique of Digital Image Correlation   [ 763 K ]
  Authors: Xiao Yuan He, Wei Sun, Xiang Zheng, Meng Nie
• p215 Yield Property Characterization for Au and TiN Thin Films by Applying Nanoindentation Technique   [ 763 K ]
  Authors: Yun Hee Lee, Yong Hak Huh, Ju Young Kim, Seung Hoon Nahm, Jae Il Jang, Dong Il Kwon
• p219 Inverse Method to Determine Mechanical Properties of Thin Film by Nanoindentation and Finite Element Analysis   [ 749 K ]
  Authors: Dong Cheon Baek, Soon Bok Lee
• p223 Residual Stress Measurement of Porous Silicon Thin Film by Substrate Curvature Method   [ 828 K ]
  Authors: Yu Xian Di, Xin Hua Ji, Ming Hu, Yu Wen Qin, Jin Long Chen
• p227 Measurement of Mechanical Properties and Residual Stresses of Bridged Gold Films and Circular Gold Membranes   [ 6 M ]
  Authors: Woo Sung Choi, S.T. Choi, Sang Uk Son, Seung Seob Lee, S.Y. Yang, Y.Y. Earmme
• p233 An Experimental Method for Micro-Scale Uniaxial Tension Test   [ 813 K ]
  Authors: Zhong Bin Tang, Fei Xu, Yu Long Li, Wu Jun Xu
• p237 Measuring Strains for Hematite Phase in Sinter Ore by Electron Backscattering Diffraction Method   [ 191 K ]
  Authors: Yasushi Sasaki, Manabu Iguchi, Mitsutaka Hino