Paper Title
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Authors: Chung Seog Oh, Sung Hoon Choa, Chang Seung Lee, Hak Joo Lee
Abstract:The accurate characterization of linear coefficient of thermal expansion (CTE) of thin films is vital for predicting the thermal stress,...
199
Authors: Feng Yuan Chen, Rwei Ching Chang
Abstract:This work presents a comparison of numerical simulation and experiment of nanoindentation testing. A commercial finite element code ANSYS is...
203
Authors: Ki Ho Cho, Hak Joo Lee, Jae Hyun Kim, Jong Man Kim, Yong Kweon Kim, Chang Wook Baek
Abstract:We have designed and fabricated diamond-shaped AFM cantilevers capable of performing multi-functioning tasks by using single crystal silicon...
207
Authors: Xiao Yuan He, Wei Sun, Xiang Zheng, Meng Nie
Abstract:It is critical to measure the static and dynamic deformation of the micro beam over their full range of voltage and frequency inputs, which...
211
Authors: Yun Hee Lee, Yong Hak Huh, Ju Young Kim, Seung Hoon Nahm, Jae Il Jang, Dong Il Kwon
Abstract:We tried to apply the nanoindentation technique to yield strength characterization by modifying a previous research. Although the yield...
215
Authors: Dong Cheon Baek, Soon Bok Lee
Abstract:As a reliable tool to measure the Young’s modulus, nanoindention technique has been used widely recently. In this paper, nanoindetation...
219
Authors: Yu Xian Di, Xin Hua Ji, Ming Hu, Yu Wen Qin, Jin Long Chen
Abstract:Extensive research has been done on porous silicon (PS) and its applications in optoelectronics since the discovery of its light emitting...
223
Authors: Woo Sung Choi, S.T. Choi, Sang Uk Son, Seung Seob Lee, S.Y. Yang, Y.Y. Earmme
Abstract:In order to measure the mechanical properties of gold films on silicon substrate, two types of specimens, i.e., bridged films and circular...
227
Authors: Zhong Bin Tang, Fei Xu, Yu Long Li, Wu Jun Xu
Abstract:A micro-scale uniaxial tension test method for measuring material mechanical properties of thin film materials is introduced in this paper....
233
Authors: Yasushi Sasaki, Manabu Iguchi, Mitsutaka Hino
Abstract:Based on the relationship between quantified blurring degree of Kikuchi bands obtained by an electron backscattering diffraction (EBSD)...
237
Showing 51 to 60 of 457 Paper Titles