Rutile titanium oxide films were fabricated by reactive unbalanced magnetron sputtering. The blood compatibility is evaluated in vitro by clotting time and platelet adhesion measurement. The surface valence band electronic structure is gained by the XPS valence band spectra. The rutile titanium oxide films exhibit attractive hemocompatibility. The result of the valence band electronic structure of the films on the surface indicated that the rutile titanium oxide film represent an n-type semiconductor characteristics and the characters result in the prevention of the charge transfering between the blood and materials and overall excellent antithrombogenic properties.