Paper Title:
The Surface Valence Band Structure and Hemocompatibility of Rutile Titanium Oxide Films
  Abstract

Rutile titanium oxide films were fabricated by reactive unbalanced magnetron sputtering. The blood compatibility is evaluated in vitro by clotting time and platelet adhesion measurement. The surface valence band electronic structure is gained by the XPS valence band spectra. The rutile titanium oxide films exhibit attractive hemocompatibility. The result of the valence band electronic structure of the films on the surface indicated that the rutile titanium oxide film represent an n-type semiconductor characteristics and the characters result in the prevention of the charge transfering between the blood and materials and overall excellent antithrombogenic properties.

  Info
Periodical
Key Engineering Materials (Volumes 330-332)
Main Theme
Edited by
Xingdong Zhang, Xudong Li, Hongsong Fan, Xuanyong Liu
Pages
605-608
DOI
10.4028/www.scientific.net/KEM.330-332.605
Citation
L. X. Xu, Y. X. Leng, Q. Zhang, P. Yang, N. Huang, "The Surface Valence Band Structure and Hemocompatibility of Rutile Titanium Oxide Films", Key Engineering Materials, Vols. 330-332, pp. 605-608, 2007
Online since
February 2007
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$32.00
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