Ablated Transformation and Dielectric of SiO2/SiO2 Nanocomposites Dipped with Silicon Resin |
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| Journal | Key Engineering Materials (Volumes 336 - 338) |
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| Volume | High-Performance Ceramics IV |
| Edited by | Wei Pan and Jianghong Gong |
| Pages | 1239-1241 |
| DOI | 10.4028/www.scientific.net/KEM.336-338.1239 |
| Citation | Mao Sheng Cao et al., 2007, Key Engineering Materials, 336-338, 1239 |
| Online since | April, 2007 |
| Authors | Mao Sheng Cao, Hai Bo Jin, Jin Gang Li, Liang Zhang, Qiang Xu, Xiang Li, Lan Tian Xiong |
| Keywords | Ablation, High Temperature Dielectric Properties, Silicon Dioxide, Transformation |
| Abstract | SiO2/ SiO2 nanocomposites dipped with silicon resin was ablated and the physical state and phase transformation were characterized. Trace impurity in raw material and compound obtained by chemical reaction were analyzed. Moreover, the high-temperature dielectric properties were investigated. On the basis of above, it is found that the impurity carbon and silicon carbide are the key factors influencing dielectric properties. |
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