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Study on Ferroelectric Properties of Nd-Doped Bi4Ti3O12 Thin Films Prepared by Sol-Gel Method

Journal Key Engineering Materials (Volumes 336 - 338)
Volume High-Performance Ceramics IV
Edited by Wei Pan and Jianghong Gong
Pages 146-148
DOI 10.4028/www.scientific.net/KEM.336-338.146
Citation Y.H. Sun et al., 2007, Key Engineering Materials, 336-338, 146
Online since April, 2007
Authors Y.H. Sun, X.B. Liu, Min Chen, J. Liu, S. Chen, Z.M. Wan
Keywords Bi4Ti3O12, Doping, Ferroelectric, Thin Film
Abstract

Nd-doped bismuth titanate Bi4-xNdxTi3O12 (BNT) thin films were fabricated on Pt/Ti/SiO2/Si substrates by sol-gel method and spin-coating technique. The structures and the ferroelectric properties of the films were investigated. Nd doping leads to a marked improvement in the remanent polarization (Pr) and the coercive field (Ec). At the applied electric field of 260 kV/cm, Pr and Ec of the BNT film with x=0.5 annealed at 650oC are 19 μC/cm2 and 135 kV/cm, respectively. Moreover, the BNT film with x=0.5 showed a fatiguefree behavior up to 3×1010 read/write cycles.

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