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Assessment of the Surface Morphology of Diamond Film Based on Fractal

Journal Key Engineering Materials (Volumes 336 - 338)
Volume High-Performance Ceramics IV
Edited by Wei Pan and Jianghong Gong
Pages 2543-2545
DOI 10.4028/www.scientific.net/KEM.336-338.2543
Citation Jiang Li Lin et al., 2007, Key Engineering Materials, 336-338, 2543
Online since April, 2007
Authors Jiang Li Lin, Jun Guo Ran, Tian Fu Wang, Li Gou, Ya Hui Hua, Xiao Ming Liao
Keywords Diamond Film, Fractal Box Dimension, Resistivity, Surface Morphology
Abstract

The surface morphology of film material directly affects its physical performance. It is of great significance for finding out its prospective physical performance to characterize the surface morphology of film material. It is hard to characterize them with some conventional methods. The surface morphology of film material was described from the fractal point of view, and the dimension was correlated with the resistivity of material. The [100]-orientated diamond film was primarily investigated. The results show that the greater the crystal grain is, the more uniform and regular the orientation is; and the more compact the arrangement is, the greater the fractal box dimension is. Moreover, when fractal box dimensions were within a certain range approximately from 2.92 to 2.97, it presents positively correlative relation with the logarithm of resistivity, Log(ρ), which resembles the Logistic curve. However, when the other dimensions are beyond the range mentioned above, resistivity doesn’t change with the increase in dimensions of fractal. This study will conduce to illustrating the relationship between the structure of crystal exemplified by arrangement and physical performance as well as material preparation.

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