Paper Title:
Microstructure and Optical Characterization of Au/SiO2 Nano-Composite Multilayer Films
  Abstract

Au/SiO2 nano-composite multilayer thin films with different thickness were prepared on a quartz substrate by magnetron plasma sputtering. The microstructure, morphology and optical properties of the films were investigated by using TEM and optical absorption spectra. [Au/SiO2]×5 and [Au/SiO2] × 11 multilayer thin films have well-defined interface. The thickness of the multilayer was 60nm and 130 nm for the thin films with 5 and 11 layers, respectively. The optical absorption peaks due to the surface plasma resonance appeared at a wavelength of 560 nm for the both [Au/SiO2]×5 and [Au/SiO2]×11 thin films. The intensity of the absorption peak increased with increasing numbers of deposition layers. The optical absorption spectra of Au/SiO2 multilayer thin films are well agreement with the theoretical optical absorption spectra calculated from rewritten Maxwell–Garnett effective medium theory.

  Info
Periodical
Key Engineering Materials (Volumes 336-338)
Edited by
Wei Pan and Jianghong Gong
Pages
2575-2578
DOI
10.4028/www.scientific.net/KEM.336-338.2575
Citation
Y. Zhang, B. P. Zhang, L. S. Jiao, X. Y. Li, H. Masumoto, T. Goto, "Microstructure and Optical Characterization of Au/SiO2 Nano-Composite Multilayer Films", Key Engineering Materials, Vols. 336-338, pp. 2575-2578, 2007
Online since
April 2007
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$32.00
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