Degradation Aging of BaTiO3 Microwave Ceramic Capacitors for EMI Applications at High-Voltage |
|
| Journal | Key Engineering Materials (Volumes 336 - 338) |
|---|---|
| Volume | High-Performance Ceramics IV |
| Edited by | Wei Pan and Jianghong Gong |
| Pages | 371-373 |
| DOI | 10.4028/www.scientific.net/KEM.336-338.371 |
| Citation | Zhao Xian Xiong et al., 2007, Key Engineering Materials, 336-338, 371 |
| Online since | April, 2007 |
| Authors | Zhao Xian Xiong, Z.G. Su, Hong Qiu |
| Keywords | Degradation Aging, Microwave Ceramic Capacitor, Reliability |
| Abstract | Degradation aging of BaTiO3 microwave ceramic capacitors for EMI applications at highvoltage, AC 10kV, was focused in this paper. Electric performances of the ceramic capacitors were systematically evaluated with thermal shock (5 cycles of –30 ºC for 1 h and then 125ºC for 1 h), damp heat (100% RH at 40ºC for 500 h), and, endurance at high temperature (DC 10 kV at 100ºC for 500 h). High reliability for the ceramic capacitor was obtained with optimal ceramic composition, sintering temperature, epoxy resin, curing agent and additives, which was satisfied with practical microwave technologies. |
| Full Paper | 
Get the full paper by clicking here
|
First page example
