Paper Title:
Dielectric Properties of Pb(Zr,Ti)O3 Heterolayered Thick Films Fabricated by Screen-Printing Method
  Abstract

Ferroelectric PZT heterolayered thick films were fabricated by the alkoxide-based sol-gel method. PZT(20/80) and PZT(80/20) paste were made and alternately screen-printed on the alumina substrates. The coating and drying procedure was repeated 4 times to form the heterolayered thick films. The thickness of the PZT heterolayered thick films was approximately 60 μm. All PZT thick films showed the typical XRD patterns of a perovskite polycrystalline structure. The relative dielectric constant and the dielectric loss of the PZT thick films sintered at 1050oC were 283 and 1.90%, respectively.

  Info
Periodical
Key Engineering Materials (Volumes 336-338)
Edited by
Wei Pan and Jianghong Gong
Pages
381-383
DOI
10.4028/www.scientific.net/KEM.336-338.381
Citation
S. G. Lee, Y. J. Shim, C. J. Kim, W. T. Bae, K. H. Hwang, Y. H. Lee, J. K. Chung, "Dielectric Properties of Pb(Zr,Ti)O3 Heterolayered Thick Films Fabricated by Screen-Printing Method", Key Engineering Materials, Vols. 336-338, pp. 381-383, 2007
Online since
April 2007
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$32.00
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