Paper Title:
Microstructural and Micromorphological Studies on ZnSe Single Crystals Using AFM/FE-SEM/RO-XRD
  Abstract

The microstructure and surface micromorphology of ZnSe single crystals grown directly from zinc and selenium have been investigated using rotation orientation x-ray diffraction (RO-XRD), atomic force microscope (AFM) and field emission scanning electron microscope (FE-SEM). The ZnSe samples exhibit only the surface leaning to (111) singular face by the angle of 3.13°, which is the buildup of two-dimensional dendritic crystal layers. Numerous nuclei and cavities distribute unevenly across the crystal surface, governing the formation of growth layer, while the dendritic crystal layers develop rapidly by margining the smaller nuclei. The formation of these microstructure and micromorphology on the surface of ZnSe crystals depends on the surface supersaturation and the growth parameters.

  Info
Periodical
Key Engineering Materials (Volumes 336-338)
Edited by
Wei Pan and Jianghong Gong
Pages
633-636
DOI
10.4028/www.scientific.net/KEM.336-338.633
Citation
H. Y. Li, W. Q. Jie, X. Q. Wang, K. W. Xu, "Microstructural and Micromorphological Studies on ZnSe Single Crystals Using AFM/FE-SEM/RO-XRD", Key Engineering Materials, Vols. 336-338, pp. 633-636, 2007
Online since
April 2007
Export
Price
$32.00
Share

In order to see related information, you need to Login.

In order to see related information, you need to Login.

Authors: Supawadee Pokai, Puenisara Limnonthakul, Mati Horprathum, Sukon Kalasung, Pitak Eiamchai, Saksorn Limwichean, Noppadon Nuntawong, Viyapol Pattantsetakul, Suparat Tuscharoen, Jakrapong Kaewkhao
Chapter 2: Nanosciences and Nanotechnology
Abstract:Zinc oxide (ZnO) nanorods (NRs) promise high potentials in several applications, such as photovoltaic device, thermoelectric device, sensor...
53
Authors: Lars Fahlbusch, Michael Schöler, Patrick Mattle, Sarah Schnitzer, Hossein Khodamoradi, Naoya Iwamoto, Bengt G. Svensson, P.J. Wellmann
1.1 Bulk Growth
Abstract:We developed a solution growth process related to the combination of the Vertical Bridgman and Vertical Gradient Freeze in a metal free Si-C...
33